Optical Inline metrology with digital holography: the ongoing path from lab into production (Conference Presentation)
An overview of the current state of the art in digital holography for surface topography measurements and applications from different productions with no alternative to digital holography are presented. We show the HoloTop sensor family, which has been designed specifically for industrial use, and present the most recent results achieved in real-life industrial applications. We start with a description of the first-ever inline integration of a digital holographic measurement system that inspects precision turned parts for the automotive industry and proceed by presenting measurements performed with a compact sensor that can be mounted in a tooling machine or at a coordinate measurement system. And finally, the quality control of electronic interconnectors such as micro-bumps with the highest demands for accuracy and repeatability is demonstrated. All these applications illustrate the potential of holography for modern data driven production.
Authors
- Marc Johannes Aslan (ORCID: https://orcid.org/0000-0002-9627-1192)
- Alexander Bertz
- Tobias Seyler (ORCID: https://orcid.org/0000-0002-0717-0956)
- Annelie Schiller (ORCID: https://orcid.org/0000-0001-7378-3980)
- Markus Fratz (ORCID: https://orcid.org/0000-0001-5688-6996)
- Daniel Carl (ORCID: https://orcid.org/0000-0002-7712-1893)
- Tobias Störk (ORCID: https://orcid.org/0009-0006-9784-8359)
Institutions
- Fraunhofer Institute for Physical Measurement Techniques (DE)
Publication Details
- Published
- 2025-08-08
- DOI
- https://doi.org/10.1117/12.3062281
- Primary Topic
- Digital Holography and Microscopy
- Type
- article
- Field-Weighted Citation Impact
- 0.00