Application of depth of focus in confocal microscopy systems

Current confocal systems depend on precise sample-stage displacement for focal plane alignment, raising cost and complexity. By leveraging laser focus depth for axial scanning and optical pinhole integration, this work eliminates displacement stages. Demonstrated lateral/axial resolutions reach 500 nm/57 nm—double conventional system precision—while streamlining design, cutting costs, and enhancing imaging efficiency. This cost-effective, high-performance approach advances confocal microscopy for nanoscale analysis of chemical/material structures.