Characterization of femtosecond laser-structured materials using interference microscopy: local spectroscopy, colorimetry, and topography

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Published
2025-08-08
DOI
https://doi.org/10.1117/12.3065979
Primary Topic
Laser Material Processing Techniques
Type
article
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Characterization of femtosecond laser-structured materials using interference microscopy: local spectroscopy, colorimetry, and topography

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Laser Material Processing Techniques
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Characterization of femtosecond laser-structured materials using interference microscopy: local spectroscopy, colorimetry, and topography

Sébastien Marbach, Sylvain Lecler, Christophe Cordier, Jesse Schiffler, Paul Montgomery, Essia Belhaj, Olivier Félix, Farid Mahfoud, Manuel Flury, Matthias Pauly, Baptiste De Azevedo
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Abstract

No abstract available for this paper.
École Normale Supérieure de Lyon (FR), Centre National de la Recherche Scientifique (FR), Institut Charles Sadron (FR), Laboratoire des Sciences de l'Ingénieur, de l'Informatique et de l'Imagerie (FR)
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Laser Material Processing Techniques
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