GMUNet-ILT: A lightweight MLP-based network for Inverse Lithography Technology

With the continuous scaling down of critical dimension (CD) in advanced integrated circuits, Resolution Enhancement Techniques (RETs) are employed to improve the printing performance in lithography processes. Inverse lithography, a widely studied RET, precisely controls the printed images on wafers. As a type of computational lithography, inverse lithography often incurs significant computational costs. Therefore, this paper proposes a lightweight and fast deep learning convolutional network architecture for computational lithography, which is based on an improved U-Net incorporating shifted-window multi-layer perceptron and Ghost modules. Our approach achieves relatively low mask error and a runtime of less than 5 seconds.

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Publication Details

Published
2025-05-09
DOI
https://doi.org/10.1109/iseda65950.2025.11100354
Citations
1
Primary Topic
Advancements in Photolithography Techniques
Type
article
Field-Weighted Citation Impact
0.73
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article

GMUNet-ILT: A lightweight MLP-based network for Inverse Lithography Technology

Kun Ren, Dawei Gao, Yongyu Wu, Ke Wang et al.
1 citations
Advancements in Photolithography Techniques
0.73
article

GMUNet-ILT: A lightweight MLP-based network for Inverse Lithography Technology

Kun Ren, Dawei Gao, Yongyu Wu, Ke Wang, Zebang Lin, Shibin Xu
article en
1 citations

Abstract

With the continuous scaling down of critical dimension (CD) in advanced integrated circuits, Resolution Enhancement Techniques (RETs) are employed to improve the printing performance in lithography processes. Inverse lithography, a widely studied RET, precisely controls the printed images on wafers. As a type of computational lithography, inverse lithography often incurs significant computational costs. Therefore, this paper proposes a lightweight and fast deep learning convolutional network architecture for computational lithography, which is based on an improved U-Net incorporating shifted-window multi-layer perceptron and Ghost modules. Our approach achieves relatively low mask error and a runtime of less than 5 seconds.

Zhejiang Lab (CN), Zhejiang Medicine (China) (CN)
Openalex Percentile: Top 25%
Advancements in Photolithography Techniques
0.73
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