Compact Pattern Display Tester for Reconfigurable Intelligent Surface

Reconfigurable Intelligent Surface (RIS) is a candidate for 6G which reflects signals to enhance coverage in the last mile or blocked areas. A matrix of antennas adjusts via a user interface to a certain pattern for a targeted direction by a controller. In this paper, a Pattern Display Tester for RIS is proposed. Due to different conditions and environments where RIS are placed over time, faulty issues are possible to occur. Software alone might not show the real condition of the hardware. Testing of any data flow state or pattern updates can be visualized from software to hardware. Potentially any faulty can be compared between the RIS on-site and the tester. The display can also assist in testing simulations in the lab without the antenna.