In-Field Deterministic Logic BIST under PVT-Variations

Safety-critical systems in automotive, air or space applications integrate the infrastructure for deterministic logic built-in self-test (DLBIST) to be used in the field periodically and at power-on and power-off. The BIST has to be effective for any admissible instance subject to process variations and under any admissible condition due to voltage and temperature fluctuations. This contribution discusses DLBIST solutions which optimize fault coverage, test storage requirements and test application times simultaneously.