Simulation of Dual-Frequency Sensor for Durian Quality Assessment
Durian, often referred to as the "King of Fruits," plays a vital role in Thailand’s economy. Moreover, quality assessment is essential to meet growing market demands and ensure consumer satisfaction. However, traditional methods for evaluating durian quality typically rely on destructive techniques that are time-consuming and labor-intensive. This study introduces a nondestructive method that combines dual-frequency system analysis to classify ripeness and immature durian. The dual-frequency approach simulated transmitting a microwave signal to a concentric dielectric sphere. The higher frequency yields backscattered wave from the outer sphere, while the lower frequency provides information about backscattered wave from both the outer and inner spheres. Then, the backscattered wave of lower frequency was subtracted from that of higher frequency which the backscattered wave from the inner sphere (Γ<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">pulp</inf>) can be obtained. As results, the dual-frequency approach was simulated with the immature and ripeness durian models. The results reveals that the magnitude of the backscattered wave (|Γ<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">pulp</inf>|) from the ripeness durian model is significantly larger than the immature durian model. Therefore, the proposed approach is appropriate and possible for quality control of durian.
Authors
- Chainarong Kittiyanpunya (ORCID: https://orcid.org/0000-0001-8724-6174)
- Bancha Luadang (ORCID: https://orcid.org/0000-0001-7290-9844)
- Nattawat Chantasen
- Pongsathorn Chomdee (ORCID: https://orcid.org/0000-0001-8642-6122)
- Chulalak Talubnak
- Patchareewan Prongjit
Institutions
- Navamindradhiraj University (TH)
- Rajamangala University of Technology Rattanakosin (TH)
- Rajamangala University of Technology Phra Nakhon (TH)
- Chandrakasem Rajabhat University (TH)
Publication Details
- Published
- 2025-05-20
- DOI
- https://doi.org/10.1109/ecti-con64996.2025.11101264
- Primary Topic
- Microwave and Dielectric Measurement Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00