Differential-Mode Characterization of Multi-Port Passives up to 170GHz Using Independent Single-Ended Two-Port Measurements
Fully differential measurements in D-band <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$(110-170 \text{GHz})$</tex> are challenging due to the absence of differential multi-port measurement equipment. This work presents a methodology to enable full differential-mode characterization up to 170 GHz exploiting consecutive single-ended measurements. The measurement methodology is experimentally validated by multi-sample characterization of a differential 4-port quadrature hybrid designed in 22 nm FDSOI technology.
Authors
- Kostas Doris (ORCID: https://orcid.org/0000-0003-1500-0241)
- Georgi Radulov (ORCID: https://orcid.org/0000-0002-0746-7928)
- Thiago H. Both (ORCID: https://orcid.org/0000-0003-0016-1894)
- R. Schalk
- M. Neofytou
- Maarten Lont
- Vojkan Vidojković
- L.F. Tiemeijer
Institutions
- NXP (Netherlands) (NL)
- Eindhoven University of Technology (NL)
Publication Details
- Published
- 2025-06-15
- DOI
- https://doi.org/10.1109/ims40360.2025.11103852
- Primary Topic
- Radio Frequency Integrated Circuit Design
- Type
- article
- Field-Weighted Citation Impact
- 0.00