APEX: Automating Parameter Extraction of Compact Models with Differential Neural Network Approximation

The traditional compact model parameter extraction highly depends on engineers' expertise, leading to a time-consuming and iterative process. To address the above issue, this paper proposes an automatic parameter extraction method for compact models, APEX. The proposed APEX framework adopts an artificial neural network (ANN) method as an approximation of compact models using model parameters as inputs and IV/CV data as outputs. The model parameters are efficiently extracted using an automatic differential mechanism based on the ANN-approximated compact model. Experimental results demonstrate that our proposed framework achieves good fitting accuracy and scalability across device structures when evaluating GAA and FinFET devices. A fitting error of less than 4% is achieved on the open-source benchmark.

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Publication Details

Published
2025-05-09
DOI
https://doi.org/10.1109/iseda65950.2025.11100460
Primary Topic
Machine Learning in Materials Science
Type
article
Field-Weighted Citation Impact
0.00

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article

APEX: Automating Parameter Extraction of Compact Models with Differential Neural Network Approximation

Bingyi Ye, Yang Shen, Yabin Sun, Jun Dou et al.
Machine Learning in Materials Science
article

APEX: Automating Parameter Extraction of Compact Models with Differential Neural Network Approximation

Bingyi Ye, Yang Shen, Yabin Sun, Jun Dou, Yuhang Zhang, Xiaojin Li, Jianing Zhang, Yanling Shi
article en

Abstract

The traditional compact model parameter extraction highly depends on engineers' expertise, leading to a time-consuming and iterative process. To address the above issue, this paper proposes an automatic parameter extraction method for compact models, APEX. The proposed APEX framework adopts an artificial neural network (ANN) method as an approximation of compact models using model parameters as inputs and IV/CV data as outputs. The model parameters are efficiently extracted using an automatic differential mechanism based on the ANN-approximated compact model. Experimental results demonstrate that our proposed framework achieves good fitting accuracy and scalability across device structures when evaluating GAA and FinFET devices. A fitting error of less than 4% is achieved on the open-source benchmark.

East China Normal University (CN)
National Natural Science Foundation of China
Openalex Percentile: Top 85%
Machine Learning in Materials Science
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