Characterization of MXene Samples Synthesized via MILD Method for RF and Microwave Applications

This work presents the characterization of in-house prepared, Titanium-based MXene (Ti<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf>C<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>T<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">x</inf>) synthesized by the Minimally Intensive layer Delamination (MILD) method. A test fixture compatible with an LCR Meter has been prototyped for characterization of the MXene samples. The first method involved using Polyethylene foam cushion to create pressure on the MXene samples to ensure proper terminal connection and recording values until the samples under test fractured.The second method used silver conductive paste combined with pressure at the contact area for stable measured values. The sheet resistance of the in-house prepared MXene was measured to be 24.27 Ω/sq. While the measurement process can still be improved, the results demonstrate the potential of MXene with a good conductivity for RF and microwave applications including but not limited to EMI shielding, flexible electronics, and MXene-based sensors.