Wave scattering from graphene-covered circular dielectric wire collections analysed using the single-wire part inversion: diffraction radiation case
We consider infrared (IR)-range diffraction radiation (DR) from finite configurations of circular graphene-covered dielectric nanowires excited by the density-modulated beam of charged particles. The beam velocity is assumed constant, and its field in the free space is considered as the incident one. The characterization of graphene employs the quantum-theory Kubo formalism and the resistive-sheet boundary conditions involving the frequency-dependent graphene surface impedance. To transform the problem into a well-conditioned algebraic equation for the field expansion coefficients, we use the separation of variables in the local coordinates and the addition theorem for the cylindrical functions. This leads to explicit inversion of the single-wire part of the problem, i.e. to the regularization, provides easy control of the accuracy and enables us to study fine resonance effects associated with the natural modes of the wire collections as open resonators.This article is part of the theme issue 'Analytically grounded full-wave methods for advances in computational electromagnetics'.
Authors
- Denys M. Natarov (ORCID: https://orcid.org/0000-0003-4170-9211)
- Alexander I. Nosich (ORCID: https://orcid.org/0000-0002-3446-8168)
- Mario Lucido (ORCID: https://orcid.org/0000-0001-8661-5601)
- Dariia O. Herasymova (ORCID: https://orcid.org/0000-0001-6569-1226)
- Sergii V. Dukhopelnykov (ORCID: https://orcid.org/0000-0002-0639-988X)
Institutions
- Università degli studi di Cassino e del Lazio Meridionale (IT)
- Institut Supérieur de l'Électronique et du Numérique (FR)
- Nanomaterials Research (United States) (US)
- Institut de Physique de Rennes (FR)
- O.Ya. Usikov Institute for Radiophysics and Electronics (UA)
- Institute of Radiophysics and Electronics (AM)
- Université de Rennes (FR)
Publication Details
- Journal
- Philosophical Transactions of the Royal Society A Mathematical Physical and Engineering Sciences
- Published
- 2025-08-14
- DOI
- https://doi.org/10.1098/rsta.2024.0344
- Citations
- 1
- Primary Topic
- Integrated Circuits and Semiconductor Failure Analysis
- Type
- article
- Field-Weighted Citation Impact
- 0.73