On the Correlation Between Dynamic-Q<sub>OSS</sub> and Dynamic-R<sub>ON</sub> in GaN-Based HEMTs
In this brief, we investigate the correlation between dynamic-<italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">Q</i><sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><roman>OSS</roman></sub> and dynamic-<italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R</i><sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><roman>ON</roman></sub> of 650-V packaged AlGaN/GaN high-electron-mobility transistors (HEMTs). To this end, a novel measurement setup is proposed to evaluate the on-the-fly evolution of both parameters during conventional switch-mode operations. The measurements performed at <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">V</i><sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><roman>DS</roman></sub>= 200 V show that the dynamic-<italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R</i><sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><roman>ON</roman></sub> and dynamic-<italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">Q</i><sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><roman>OSS</roman></sub> present similar exponential transients and time constants, potentially explained by the ionization of C-related acceptors in the GaN buffer. The same activation energy (<italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">E</i><sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><roman>A</roman></sub><roman xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">)</roman> has been observed for both <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">Q</i><sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><roman>OSS</roman></sub> and <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R</i><sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><roman>ON</roman></sub>, suggesting that their drifts are related to the same physical mechanism. The characterization has also been performed at different <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">V</i><sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><roman>DS</roman></sub> levels, indicating that the observed correlation holds in the entire range up to 520 V.
Authors
- Marcello Cioni (ORCID: https://orcid.org/0000-0001-8302-6641)
- Alessandro Chini (ORCID: https://orcid.org/0000-0002-5865-271X)
- Viviana Cerantonio
- Maria Eloisa Castagna (ORCID: https://orcid.org/0000-0002-7864-6085)
- Maurizio Moschetti (ORCID: https://orcid.org/0000-0002-3349-1649)
- A. Constant (ORCID: https://orcid.org/0000-0002-0957-7450)
- Giovanni Giorgino (ORCID: https://orcid.org/0000-0002-9462-0328)
- Cristina Miccoli (ORCID: https://orcid.org/0009-0007-4939-3625)
- Davide Maria Lombardo (ORCID: https://orcid.org/0000-0003-2472-8656)
- Salvatore Strano (ORCID: https://orcid.org/0000-0003-2697-2273)
- Giacomo Cappellini (ORCID: https://orcid.org/0009-0003-8528-0485)
- Ferdinando Iucolano
- Tariq Wakrim
Institutions
- University of Modena and Reggio Emilia (IT)
- STMicroelectronics (France) (FR)
- STMicroelectronics (Italy) (IT)
- Ferrari (Italy) (IT)
Publication Details
- Journal
- IEEE Transactions on Electron Devices
- Published
- 2025-08-11
- DOI
- https://doi.org/10.1109/ted.2025.3595562
- Primary Topic
- GaN-based semiconductor devices and materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00