A Low-cost DAC Chip Function and Performance Testing Scheme

In view of the high cost of mixed signal test system and the inability of board level test to implement the performance test of DAC chips, this paper proposes a low-cost functional and performance test scheme for DAC chips. The scheme proposed in this paper realizes the measurement of DAC output voltage through the auxiliary board with ARM chip as the core component, and realizes the automatic test by communicating with ATE's industrial computer. Through the design of additional test vectors, the precise matching of input and output data under the condition of clock free synchronization is realized, which ensures the accuracy of parameter calculation. Finally, the scheme proposed in this paper is verified through experiments, and the experimental results verify the feasibility of the scheme.