Knowledge-Based Multi-Path Neural Networks for Modeling Through Packaging Glass Vias
This work introduces a novel approach for analyzing signal integrity in coaxial through-glass vias (TGVs) using advanced machine learning techniques. The study utilizes a knowledge-based multi-path neural network to assess the signal integrity of coaxial-TGVs by predicting parasitics like resistance and inductance across varied frequency and temperature ranges. By leveraging a driver-via-load model, the proposed architecture provides accurate assessments of coaxial-TGVs, making it highly suitable for high-frequency, temperature-sensitive applications.
Authors
- Rohit Dhiman (ORCID: https://orcid.org/0000-0001-9059-5885)
- K. Madhu Kiran (ORCID: https://orcid.org/0000-0002-9274-2524)
- Suyash Sachdeva (ORCID: https://orcid.org/0009-0002-6801-4671)
Institutions
- National Institute of Technology Hamirpur (BD)
Publication Details
- Published
- 2025-06-02
- DOI
- https://doi.org/10.1109/iitc66087.2025.11075494
- Citations
- 1
- Primary Topic
- 3D IC and TSV technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.73