Knowledge-Based Multi-Path Neural Networks for Modeling Through Packaging Glass Vias

This work introduces a novel approach for analyzing signal integrity in coaxial through-glass vias (TGVs) using advanced machine learning techniques. The study utilizes a knowledge-based multi-path neural network to assess the signal integrity of coaxial-TGVs by predicting parasitics like resistance and inductance across varied frequency and temperature ranges. By leveraging a driver-via-load model, the proposed architecture provides accurate assessments of coaxial-TGVs, making it highly suitable for high-frequency, temperature-sensitive applications.

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Publication Details

Published
2025-06-02
DOI
https://doi.org/10.1109/iitc66087.2025.11075494
Citations
1
Primary Topic
3D IC and TSV technologies
Type
article
Field-Weighted Citation Impact
0.73
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article

Knowledge-Based Multi-Path Neural Networks for Modeling Through Packaging Glass Vias

Rohit Dhiman, K. Madhu Kiran, Suyash Sachdeva
1 citations
3D IC and TSV technologies
0.73
article

Knowledge-Based Multi-Path Neural Networks for Modeling Through Packaging Glass Vias

Rohit Dhiman, K. Madhu Kiran, Suyash Sachdeva
article en
1 citations

Abstract

This work introduces a novel approach for analyzing signal integrity in coaxial through-glass vias (TGVs) using advanced machine learning techniques. The study utilizes a knowledge-based multi-path neural network to assess the signal integrity of coaxial-TGVs by predicting parasitics like resistance and inductance across varied frequency and temperature ranges. By leveraging a driver-via-load model, the proposed architecture provides accurate assessments of coaxial-TGVs, making it highly suitable for high-frequency, temperature-sensitive applications.

National Institute of Technology Hamirpur (BD)
Openalex Percentile: Top 25%
3D IC and TSV technologies
0.73
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