Versatile Development of Test-Hardware in a Systemc-Ams Virtual Testing Framework

This article presents the application of a previously developed SystemC-AMS Virtual Testing Framework to the complete design of the probe-card, and the development of key test-functions, for a specific industrial automatic test-solution. The Framework, which is based on SystemC-AMS and supported by the COSIDE graphical design environment, is aimed at the optimisation of test-hardware design and test-program coding, by allowing pre-silicon validation of the test-solution. Several improvements have been made to the Framework, such as updated models of automatic test equipment resources and non-linear components, test-flow control via input file, and streamlined implementation of component libraries. By developing the probe-card within the SystemC-AMS Virtual Testing Framework several aspects of its functionality can be investigated, including robustness of the schematic, integrity of the analog and digital signals, solutions for the measurement of notable electrical signals, and an updated current pulse generator based on the modulation of the automatic test equipment resources via active and passive components. The comparison between simulation results and bench measurements performed within the test-program execution on the produced physical probe-card, highlights the capability of the Framework in offering comprehensive support to the development of automatic test-solutions.