The Uncertainty of the Indirect Thermographic Measurement of the Temperature of the Semiconductor Element
The indirect thermographic measurement of the temperature of a semiconductor element consists of two parts. The first part consists of performing a thermographic measurement of the temperature case. The second part consists of determining the relationship between the temperature case and the temperature of the semiconductor element. Such a measurement is the subject to the uncertainty. As a result of the carried out work, the uncertainty of the indirect thermographic measurement of the temperature of the semiconductor element was determined.
Authors
- P. Otomański (ORCID: https://orcid.org/0000-0002-1535-5731)
- Arkadiusz Hulewicz (ORCID: https://orcid.org/0000-0001-9342-7430)
- Krzysztof Dziarski (ORCID: https://orcid.org/0000-0002-7877-4116)
Institutions
- Poznań University of Technology (PL)
Publication Details
- Published
- 2025-06-02
- DOI
- https://doi.org/10.23919/measurement66999.2025.11078693
- Primary Topic
- Thermography and Photoacoustic Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00