Modeling of Optical Processes in Thin-Film IR Light-Emitting Diode Based on Colloidal PbS Quantum Dots

The optical processes in the structure of a thin-film IR LED have been simulated using the finite difference method in the time domain. The parameters such as transmission and propagation efficiency of electromagnetic waves in the range of 1.2–1.4 μm have been investigated. A control device with an indium tin oxide (ITO) layer as a transparent conducting electrode has been simulated. The replacement of the ITO layer with a fluorine-doped tin oxide (FTO) layer has been considered. It has been found that with such a replacement, the transmittance of IR radiation passing through the FTO functional layers increases to 70 %, and the angular distribution of E2 increases by 10° compared to a device with an ITO layer. Thus, it is advisable to replace the layer of the transparent conducting ITO electrode with the FTO layer.

Authors

Institutions

Publication Details

Journal
SHILAP Revista de lepidopterología
Published
2025-01-01
DOI
https://doi.org/10.35596/1729-7648-2025-23-3-19-25
Primary Topic
Quantum Dots Synthesis And Properties
Type
article
Field-Weighted Citation Impact
0.00
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Modeling of Optical Processes in Thin-Film IR Light-Emitting Diode Based on Colloidal PbS Quantum Dots

U. Y. Turavets
SHILAP Revista de lepidopterología
Quantum Dots Synthesis And Properties
article

Modeling of Optical Processes in Thin-Film IR Light-Emitting Diode Based on Colloidal PbS Quantum Dots

U. Y. Turavets
article en

Abstract

The optical processes in the structure of a thin-film IR LED have been simulated using the finite difference method in the time domain. The parameters such as transmission and propagation efficiency of electromagnetic waves in the range of 1.2–1.4 μm have been investigated. A control device with an indium tin oxide (ITO) layer as a transparent conducting electrode has been simulated. The replacement of the ITO layer with a fluorine-doped tin oxide (FTO) layer has been considered. It has been found that with such a replacement, the transmittance of IR radiation passing through the FTO functional layers increases to 70 %, and the angular distribution of E2 increases by 10° compared to a device with an ITO layer. Thus, it is advisable to replace the layer of the transparent conducting ITO electrode with the FTO layer.

SHILAP Revista de lepidopterología
Belarusian State University of Informatics and Radioelectronics (BY)
Affordable and clean energy
Openalex Percentile: Top 85%
Quantum Dots Synthesis And Properties
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.