Raman Spectroscopy-Based Studying the Physical Differences of Graphene Layers Prepared by Direct Exfoliation

This study explores the physical characteristics of graphene layers through the application of Raman spectroscopy and atomic force microscopy.Graphene samples are meticulously prepared by exfoliating natural graphite onto 300-nm SiO 2 /Si wafers.The analysis conducted at the Wolfson Nanomaterials and Devices Laboratory at Plymouth University in the UK focuses on examining the positions and intensities of the G and 2D bands in Raman spectroscopy, as well as scrutinizing atomic force microscope images.The investigation is aimed to assess various physical parameters, including the number of layers, quality, purity, domain size, and full width at half maximum (FHWM) of each graphene sample, providing valuable insights into their structural properties.This study suggests that the graphene layers on a SiO 2 /Si substrate prepared by direct exfoliating are suited for mechanical and electronic applications. - . SiO 2 /Si 300 ., , G- 2D- , - . , , , , (FHWM) , . , SiO 2 /Si, , .