Impact of Antenna Length on Microwave Transmission Characteristics of Flat Cutoff Probes

Real-time and precise monitoring of plasma parameters has become a critical requirement in advanced semiconductor and display manufacturing processes.Among various diagnostic tools, the flat cutoff probe stands out due to its ability to provide non-invasive, real-time electron density measurements near the plasma-sheath boundary.In this study, we investigate the influence of antenna structure on the microwave transmission characteristics of flat cutoff probes using electromagnetic (EM) wave simulations.EM wave simulations under vacuum conditions demonstrate that structural resonance arises when antenna length equals a quarter of the incident wavelength.In plasma environments, antenna-induced structural resonance frequencies approaching the plasma frequency obscure cutoff frequency detection, leading to unreliable electron density measurements.These results demonstrate that cutoff frequency detection is only achievable when the antenna length remains below the quarter-wavelength corresponding to the plasma frequency.Based on these results, we propose guidelines for antenna design to optimize the flat cutoff probes, which could enhance the accuracy and reliability of in-situ electron density measurements in plasma processing environments.

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Publication Details

Journal
Applied Science and Convergence Technology
Published
2025-06-07
DOI
https://doi.org/10.5757/asct.2025.34.4.129
Primary Topic
Microwave Engineering and Waveguides
Type
article
Field-Weighted Citation Impact
0.00

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article

Impact of Antenna Length on Microwave Transmission Characteristics of Flat Cutoff Probes

Young-Joo Kim, Jung‐Hyung Kim, S Park, Hyo‐Chang Lee et al.
Applied Science and Convergence Technology
Microwave Engineering and Waveguides
article

Impact of Antenna Length on Microwave Transmission Characteristics of Flat Cutoff Probes

Young-Joo Kim, Jung‐Hyung Kim, S Park, Hyo‐Chang Lee, Hee-Jung Yeom
article en

Abstract

Real-time and precise monitoring of plasma parameters has become a critical requirement in advanced semiconductor and display manufacturing processes.Among various diagnostic tools, the flat cutoff probe stands out due to its ability to provide non-invasive, real-time electron density measurements near the plasma-sheath boundary.In this study, we investigate the influence of antenna structure on the microwave transmission characteristics of flat cutoff probes using electromagnetic (EM) wave simulations.EM wave simulations under vacuum conditions demonstrate that structural resonance arises when antenna length equals a quarter of the incident wavelength.In plasma environments, antenna-induced structural resonance frequencies approaching the plasma frequency obscure cutoff frequency detection, leading to unreliable electron density measurements.These results demonstrate that cutoff frequency detection is only achievable when the antenna length remains below the quarter-wavelength corresponding to the plasma frequency.Based on these results, we propose guidelines for antenna design to optimize the flat cutoff probes, which could enhance the accuracy and reliability of in-situ electron density measurements in plasma processing environments.

Applied Science and Convergence TechnologyVol. 34(4)
Yonsei University (KR), Korea Aerospace University (KR), Korea Research Institute of Standards and Science (KR)
Ministry of Trade, Industry and Energy, Korea Research Institute of Standards and Science, National Research Council of Science and Technology, Ministry of Science and ICT, South Korea, Korea Semiconductor Research Consortium, Korea Evaluation Institute of Industrial Technology
Affordable and clean energy
Openalex Percentile: Top 82%
Microwave Engineering and Waveguides
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