Assessing High-Voltage PWM-Induced Degradation of FR4 PCBs in Aircraft Applications
With the substantial increase in transportation electrification, operating voltages have risen with the use of high-voltage and high-power electronic switches. The need for high-density power converters necessitates integrating low-voltage circuits (modulation, sensing, and control circuits) as well as high-voltage switches onto the same PCB. To achieve compactness, integrating magnetics into the PCB is also a design methodology adopted, which poses additional stresses between PCB layers. Additionally, PCB material stresses become significant when a PCB-based bus bar design is used. This work aims to develop a methodology to understand the degradation of FR4-PCBs subjected to high-voltage PWM pulses, as repetitive high-voltage pulses may impact the aging rate of the PCB.
Authors
- D. Shakthi Prasad (ORCID: https://orcid.org/0000-0002-8030-9934)
- Sheron Figarado (ORCID: https://orcid.org/0000-0001-9155-1083)
- Kranthi Panuganti
- Sheshakamal Jayaram
Institutions
- University of Waterloo (CA)
- Indian Institute of Technology Goa (IN)
Publication Details
- Published
- 2025-06-22
- DOI
- https://doi.org/10.1109/ieeeconf65845.2025.11099359
- Primary Topic
- High voltage insulation and dielectric phenomena
- Type
- article
- Field-Weighted Citation Impact
- 0.00