First Demonstration of BEOL-Compatible Co-Sputter Deposited $\text{Te}_{1-x} \text{Se}_{x}$ p-FETs Enabling 3D Stackable Oxide Semiconductor CFET, DRAM, and First CFET-Structured SRAM

We report the world's first BEOL-compatible p-type Tellurium <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">${ }_{0.8}$</tex> Selenium <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$_{0.2}\left(\text{Te}_{0.8} \text{Se}_{0.2}\right)$</tex> FETs with aggressively-scaled channel length (<tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$L_{\text{ch}}$</tex>) of 50 nm, achieved through Te-Se co-sputtering for bandgap tuning and performance improvement. Our <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\text{Te}_{0.8} \text{Se}_{0.2}$</tex> FETs exhibit outstanding performance, including a mobility of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$24 \text{cm}^{2} / \mathrm{V} \cdot \mathrm{s}$</tex>, an <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$I_{\text {on }} / I_{\text {off }}$</tex> ratio <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$&gt;10^{4}$</tex>, and a <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$S S$</tex> of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\sim 300 \text{mV} /$</tex> Dec., all among the best. This device has enabled the realization of 3D stackable IGZO/ <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\text{Te}_{0.8} \text{Se}_{0.2}$</tex> DRAM with excellent retention over 1000 s and short channel IGZO/Te <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">${ }_{0.8} \text{Se}_{0.2}$</tex> CFET, achieving a gain of 38 at <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$V_{\text{DD}}=2.5$</tex> V. Based on this CFET, we further experimentally demonstrated the world's first stacked oxide semiconductors CMOS SRAM with 4T footprint.

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Published
2025-06-08
DOI
https://doi.org/10.23919/vlsitechnologyandcir65189.2025.11075219
Citations
4
Primary Topic
Semiconductor materials and interfaces
Type
article
Field-Weighted Citation Impact
4.99

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article

First Demonstration of BEOL-Compatible Co-Sputter Deposited $\text{Te}_{1-x} \text{Se}_{x}$ p-FETs Enabling 3D Stackable Oxide Semiconductor CFET, DRAM, and First CFET-Structured SRAM

Gengchiau Liang, Zijie Zheng, Sheng Luo, Ying Xu et al.
4 citations
Semiconductor materials and interfaces
4.99
article

First Demonstration of BEOL-Compatible Co-Sputter Deposited $\text{Te}_{1-x} \text{Se}_{x}$ p-FETs Enabling 3D Stackable Oxide Semiconductor CFET, DRAM, and First CFET-Structured SRAM

Gengchiau Liang, Zijie Zheng, Sheng Luo, Ying Xu, Yuye Kang, Kai Ni, Zuopu Zhou, Chen Sun, Xiao Gong, Yiyuan Sun
article en
4 citations

Abstract

We report the world's first BEOL-compatible p-type Tellurium <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">${ }_{0.8}$</tex> Selenium <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$_{0.2}\left(\text{Te}_{0.8} \text{Se}_{0.2}\right)$</tex> FETs with aggressively-scaled channel length (<tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$L_{\text{ch}}$</tex>) of 50 nm, achieved through Te-Se co-sputtering for bandgap tuning and performance improvement. Our <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\text{Te}_{0.8} \text{Se}_{0.2}$</tex> FETs exhibit outstanding performance, including a mobility of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$24 \text{cm}^{2} / \mathrm{V} \cdot \mathrm{s}$</tex>, an <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$I_{\text {on }} / I_{\text {off }}$</tex> ratio <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$&gt;10^{4}$</tex>, and a <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$S S$</tex> of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\sim 300 \text{mV} /$</tex> Dec., all among the best. This device has enabled the realization of 3D stackable IGZO/ <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\text{Te}_{0.8} \text{Se}_{0.2}$</tex> DRAM with excellent retention over 1000 s and short channel IGZO/Te <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">${ }_{0.8} \text{Se}_{0.2}$</tex> CFET, achieving a gain of 38 at <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$V_{\text{DD}}=2.5$</tex> V. Based on this CFET, we further experimentally demonstrated the world's first stacked oxide semiconductors CMOS SRAM with 4T footprint.

University of Notre Dame (US), National Yang Ming Chiao Tung University (TW), National University of Singapore (SG)
National Science Foundation
Openalex Percentile: Top 5%
Semiconductor materials and interfaces
4.99
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