First Demonstration of BEOL-Compatible Co-Sputter Deposited $\text{Te}_{1-x} \text{Se}_{x}$ p-FETs Enabling 3D Stackable Oxide Semiconductor CFET, DRAM, and First CFET-Structured SRAM
We report the world's first BEOL-compatible p-type Tellurium <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">${ }_{0.8}$</tex> Selenium <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$_{0.2}\left(\text{Te}_{0.8} \text{Se}_{0.2}\right)$</tex> FETs with aggressively-scaled channel length (<tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$L_{\text{ch}}$</tex>) of 50 nm, achieved through Te-Se co-sputtering for bandgap tuning and performance improvement. Our <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\text{Te}_{0.8} \text{Se}_{0.2}$</tex> FETs exhibit outstanding performance, including a mobility of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$24 \text{cm}^{2} / \mathrm{V} \cdot \mathrm{s}$</tex>, an <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$I_{\text {on }} / I_{\text {off }}$</tex> ratio <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$>10^{4}$</tex>, and a <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$S S$</tex> of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\sim 300 \text{mV} /$</tex> Dec., all among the best. This device has enabled the realization of 3D stackable IGZO/ <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\text{Te}_{0.8} \text{Se}_{0.2}$</tex> DRAM with excellent retention over 1000 s and short channel IGZO/Te <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">${ }_{0.8} \text{Se}_{0.2}$</tex> CFET, achieving a gain of 38 at <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$V_{\text{DD}}=2.5$</tex> V. Based on this CFET, we further experimentally demonstrated the world's first stacked oxide semiconductors CMOS SRAM with 4T footprint.
Authors
- Gengchiau Liang (ORCID: https://orcid.org/0000-0002-9354-6509)
- Zijie Zheng (ORCID: https://orcid.org/0000-0001-8265-6019)
- Sheng Luo (ORCID: https://orcid.org/0000-0003-4523-6861)
- Ying Xu (ORCID: https://orcid.org/0000-0001-9570-8666)
- Yuye Kang (ORCID: https://orcid.org/0000-0002-9242-565X)
- Kai Ni (ORCID: https://orcid.org/0000-0002-3628-3431)
- Zuopu Zhou (ORCID: https://orcid.org/0000-0003-4812-8524)
- Chen Sun (ORCID: https://orcid.org/0000-0003-2480-2350)
- Xiao Gong
- Yiyuan Sun
Institutions
- University of Notre Dame (US)
- National Yang Ming Chiao Tung University (TW)
- National University of Singapore (SG)
Publication Details
- Published
- 2025-06-08
- DOI
- https://doi.org/10.23919/vlsitechnologyandcir65189.2025.11075219
- Citations
- 4
- Primary Topic
- Semiconductor materials and interfaces
- Type
- article
- Field-Weighted Citation Impact
- 4.99
Funders
- National Science Foundation