3D NOR-Type FeFETs with Record Endurance of 10<sup>11</sup>, Fast Erase of 50 ns, and Immediate Read-After-Write for In-Memory Learning
In this work, we experimentally demonstrate a 3D NOR-type FeFET (FeNOR) array based on ALD IGO channel. With a scaled channel area down to <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$0.007 \mu m^{2}$</tex>, the 3D FeNOR achieves a record endurance of 10<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">11</sup> cycles, 50 ns erase speed, immediate read-after-write, and minimal layer-to-layer variations. Comprehensive analysis unveils the mechanism of endurance degradation and optimization strategies. Based on multi-domain TCAD simulations, the improvement of erase speed is well-fitted with experiments and mainly attributed to blocking of percolation paths. The good density, reliability and speed make the 3D FeNOR promising for next-generation AI applications, especially in-memory learning.
Authors
- Kechao Tang (ORCID: https://orcid.org/0000-0003-4570-0142)
- Zhiyuan Ning (ORCID: https://orcid.org/0009-0000-4718-1564)
- Liang Chen (ORCID: https://orcid.org/0000-0002-5215-3936)
- Runteng Zhu
- Wenpu Luo
- Siyuan Qi
- Yuejia Zhou (ORCID: https://orcid.org/0000-0001-9702-150X)
- Hanyong Shao (ORCID: https://orcid.org/0000-0001-9350-079X)
- Xiaojian Xu (ORCID: https://orcid.org/0000-0002-2215-4364)
- Ru Huang
Institutions
- Peking University (CN)
Publication Details
- Published
- 2025-06-08
- DOI
- https://doi.org/10.23919/vlsitechnologyandcir65189.2025.11074820
- Citations
- 1
- Primary Topic
- Ferroelectric and Negative Capacitance Devices
- Type
- article
- Field-Weighted Citation Impact
- 0.73