3D NOR-Type FeFETs with Record Endurance of 10<sup>11</sup>, Fast Erase of 50 ns, and Immediate Read-After-Write for In-Memory Learning

In this work, we experimentally demonstrate a 3D NOR-type FeFET (FeNOR) array based on ALD IGO channel. With a scaled channel area down to <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$0.007 \mu m^{2}$</tex>, the 3D FeNOR achieves a record endurance of 10<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">11</sup> cycles, 50 ns erase speed, immediate read-after-write, and minimal layer-to-layer variations. Comprehensive analysis unveils the mechanism of endurance degradation and optimization strategies. Based on multi-domain TCAD simulations, the improvement of erase speed is well-fitted with experiments and mainly attributed to blocking of percolation paths. The good density, reliability and speed make the 3D FeNOR promising for next-generation AI applications, especially in-memory learning.

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Published
2025-06-08
DOI
https://doi.org/10.23919/vlsitechnologyandcir65189.2025.11074820
Citations
1
Primary Topic
Ferroelectric and Negative Capacitance Devices
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article
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article

3D NOR-Type FeFETs with Record Endurance of 1011, Fast Erase of 50 ns, and Immediate Read-After-Write for In-Memory Learning

Kechao Tang, Zhiyuan Ning, Liang Chen, Runteng Zhu, Wenpu Luo, Siyuan Qi, Yuejia Zhou, Hanyong Shao, Xiaojian Xu, Ru Huang
article en
1 citations

Abstract

In this work, we experimentally demonstrate a 3D NOR-type FeFET (FeNOR) array based on ALD IGO channel. With a scaled channel area down to <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$0.007 \mu m^{2}$</tex>, the 3D FeNOR achieves a record endurance of 10<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">11</sup> cycles, 50 ns erase speed, immediate read-after-write, and minimal layer-to-layer variations. Comprehensive analysis unveils the mechanism of endurance degradation and optimization strategies. Based on multi-domain TCAD simulations, the improvement of erase speed is well-fitted with experiments and mainly attributed to blocking of percolation paths. The good density, reliability and speed make the 3D FeNOR promising for next-generation AI applications, especially in-memory learning.

Peking University (CN)
Quality Education
Openalex Percentile: Top 25%
Ferroelectric and Negative Capacitance Devices
0.73
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