Electrical Resistance Tomography for the investigation of memristive nanowire networks

In the recent years, Electrical Resistance Tomography (ERT) has been successfully applied to map the conductivity of thin-film materials and graphene. Beyond the mapping of static conductivity distribution, ERT is proposed as a new valuable tool for the characterisation of memristive materials that present a dynamic behaviour, with tunable conductivity. In this work, we show that ERT can get insight into both the conductivity distribution and its time-evolution in memristive metallic nanowire networks, enabling the visualization of induced conductive traces on samples potentiated by means of the ERT setup itself.