A PVT-Robust $\text{16GS}/\mathrm{s} 4 \times \text{TI}$ Time-Domain ADC with Vernier-Based Multipath Flash TDC Achieving $25.7 \text{fJ} / \mathrm{c}-\mathrm{s}$ FoM in 28nm CMOS

A 4-way 16GS/s two-step time-domain ADC with Vernierbased multipath Flash TDC architecture is reported. Benefiting from the proposed Vernier-based Multipath <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\mathrm{T}_{\text {LSB }}$</tex> Generator (VMTG) and the inherently tracking delay cells, this design achieves PVT robustness for time step ratios and gain between the two stages. Fabricated in 28 nm CMOS, this ADC achieves 35.3 dB SNDR and 51.2 dB SFDR with a Nyquist input at <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$16 \text{GS} / \mathrm{s}$</tex> and it consumes 19.6 mW power, leading to a <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$25.7 \text{fJ} /$</tex> conv.-step Walden FoM.

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Publication Details

Published
2025-06-08
DOI
https://doi.org/10.23919/vlsitechnologyandcir65189.2025.11074876
Primary Topic
Analog and Mixed-Signal Circuit Design
Type
article
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article

A PVT-Robust $\text{16GS}/\mathrm{s} 4 \times \text{TI}$ Time-Domain ADC with Vernier-Based Multipath Flash TDC Achieving $25.7 \text{fJ} / \mathrm{c}-\mathrm{s}$ FoM in 28nm CMOS

Mingqiang Guo, Sai‐Weng Sin, Kun Zhang, Haoyu Li et al.
Analog and Mixed-Signal Circuit Design
article

A PVT-Robust $\text{16GS}/\mathrm{s} 4 \times \text{TI}$ Time-Domain ADC with Vernier-Based Multipath Flash TDC Achieving $25.7 \text{fJ} / \mathrm{c}-\mathrm{s}$ FoM in 28nm CMOS

Mingqiang Guo, Sai‐Weng Sin, Kun Zhang, Haoyu Li, Liang Qi, Rui P. Martins
article en

Abstract

A 4-way 16GS/s two-step time-domain ADC with Vernierbased multipath Flash TDC architecture is reported. Benefiting from the proposed Vernier-based Multipath <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\mathrm{T}_{\text {LSB }}$</tex> Generator (VMTG) and the inherently tracking delay cells, this design achieves PVT robustness for time step ratios and gain between the two stages. Fabricated in 28 nm CMOS, this ADC achieves 35.3 dB SNDR and 51.2 dB SFDR with a Nyquist input at <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$16 \text{GS} / \mathrm{s}$</tex> and it consumes 19.6 mW power, leading to a <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$25.7 \text{fJ} /$</tex> conv.-step Walden FoM.

Shanghai Jiao Tong University (CN), University of Macau (MO)
VNU Science and Technology Development Fund, National Natural Science Foundation of China, Universidade de Macau
Openalex Percentile: Top 82%
Analog and Mixed-Signal Circuit Design
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A PVT-Robust $\text{16GS}/\mathrm{s} 4 \times \text{TI}$ Time-Domain ADC with Vernier-Based Multipath Flash TDC Achieving $25.7 \text{fJ} / \mathrm{c}-\mathrm{s}$ FoM in 28nm CMOS — Mingqiang Guo, Sai‐Weng Sin, et al. · (2025) | TGRS Research Map | TGRS