A 3nm 125 Tops/W-29 TFLOPS/W, 90 TOPS/mm<sup>2</sup>-17 TFLOPS/mm<sup>2</sup> SRAM-Based INT8 and FP16 Digital-CIM Compiler with Multi-Weight Update/Cycle
This paper presents a DCIM compiler supporting INT8 and FP16 formats, offering configuration flexibility, high accuracy, and high area/power efficiency. Our 3nm test chip is fully validated and exhibits 124.6 TOPS/W at 0.5V and 90.2 TOPS/ <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\text{mm}^{2}$</tex> at 1.1 V for INT8 DCIM, and 28.6 TFLOPS/W at 0.5V and 17.4 TFLOPS <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$/ \text{mm}^{2}$</tex> at 1.1V for FP16 DCIM, respectively.
Authors
- Hong-Jen Liao
- H. Fujiwara
- T Hashizume
- Saman Adham
- Chin‐Fei Lee (ORCID: https://orcid.org/0000-0002-3024-5864)
- Chin-Lung Chuang
- Yu‐Hsin Chen (ORCID: https://orcid.org/0000-0002-9603-7371)
- Vinay Joshi (ORCID: https://orcid.org/0000-0001-6031-1669)
- Xiaoyu Sun (ORCID: https://orcid.org/0000-0001-5337-5680)
- Yuxiao Wang (ORCID: https://orcid.org/0009-0004-9454-5972)
- Weisheng S. Zhao (ORCID: https://orcid.org/0000-0001-8088-0404)
- Haruyuki Ishii (ORCID: https://orcid.org/0000-0002-9435-9246)
- Kerem Akarvardar (ORCID: https://orcid.org/0000-0001-5957-826X)
- C.H. Lee
- Emmy T. Y. Chang (ORCID: https://orcid.org/0000-0002-9886-7643)
- Charles Tsen
- Kavita Khare (ORCID: https://orcid.org/0000-0002-7704-7646)
- Brian Crafton (ORCID: https://orcid.org/0000-0002-0227-0421)
- H. Mori (ORCID: https://orcid.org/0000-0002-8149-393X)
- Xiang Peng (ORCID: https://orcid.org/0000-0003-3853-3120)
- T.-J. Chou
- Y.D. Chih
- Yudai Fujino
- Jai-Li Hung
Institutions
- Taiwan Semiconductor Manufacturing Company (United States) (US)
- Osaka Medical and Pharmaceutical University (JP)
- Taiwan Semiconductor Manufacturing Company (Taiwan) (TW)
- National Defence Medical Centre (CA)
Publication Details
- Published
- 2025-06-08
- DOI
- https://doi.org/10.23919/vlsitechnologyandcir65189.2025.11074897
- Citations
- 3
- Primary Topic
- VLSI and Analog Circuit Testing
- Type
- article
- Field-Weighted Citation Impact
- 6.81