High-Performance Monolithic 3D CMOS Enabled by Orientation-Aligned Seedless Laser Crystallization and Ultra-Shallow Laser Activation
In this study, we demonstrate PSLC Si-based CMOS devices on the M3D top layer using a seedless crystallization process. Laser crystallization forms single-orientation Si channels (<tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$25\ \mu \mathrm{m}$</tex> grain size), enhancing carrier mobility. Laser S/D activation achieves low contact resistivity <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$(\sim 10^{-8} \Omega\cdot \text{cm}^{2})$</tex> below 400 °C, meeting M3D constraints. PSLC-Si CMOS devices exhibit <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\mathrm{I}_{\text{ON}}/\mathrm{I}_{\text{OFF}} > 10^{8}$</tex> with high <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\mu_{\text{FE},\mathrm{e}}(521 \text{cm}^{2}/\mathrm{V}\cdot \mathrm{s})$</tex> and <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\mu_{\text{FE},\mathrm{h}}(163\ \text{cm}^{2}/\mathrm{V}\cdot \mathrm{s})$</tex>. CMOS inverters show clear switching transitions, confirming feasibility for M3D logic applications. These results validate the potential of a fully laser-based process for M3D-integrated logic devices. Keyword: Monolithic 3D (M3D), Patterned Seedless Laser-Crystallization (PSLC), Si, Laser activation, Mobility
Authors
- Euyjin Park (ORCID: https://orcid.org/0000-0001-9594-8651)
- Hyun‐Yong Yu (ORCID: https://orcid.org/0000-0001-9446-5981)
- Heejae Jeong (ORCID: https://orcid.org/0000-0002-6713-4746)
- Hyuk‐Jun Kwon (ORCID: https://orcid.org/0000-0002-4767-7444)
- Chan-Sol Ahn (ORCID: https://orcid.org/0000-0001-8461-4998)
- Sangsu Lee (ORCID: https://orcid.org/0000-0002-2938-4234)
- Geuntae Park (ORCID: https://orcid.org/0009-0008-4860-191X)
- Jongyoun Park (ORCID: https://orcid.org/0009-0008-7367-6083)
- Jonghwa Won
Institutions
- Daegu Gyeongbuk Institute of Science and Technology (KR)
- Korea University (KR)
Publication Details
- Published
- 2025-06-08
- DOI
- https://doi.org/10.23919/vlsitechnologyandcir65189.2025.11075072
- Primary Topic
- Thin-Film Transistor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Research Foundation of Korea