First Demonstration of Symmetric Dual-Sided Vertical FET (DSVFET) for Energy Efficient Computing (EEC): From Processes and Devices to Circuits
For the first time, we proposed and demonstrated the symmetric dual-sided vertical FET (DSVFET) experimentally. The DSVFET not only inherits low leakage, drive voltage and parasitic benefits from the standard VFET but also features unique dual-sided S/Ds with smaller footprint and better symmetry, perfectly suiting the energy efficient computing. A series of new processes and DTCO methods were developed to study the device structure, performance and circuit design. DSVFET with aggressive contact gate pitch (CGP) of 50 nm and <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\text{Lg}_{\mathrm{g}}$</tex> of 19 nm was realized. DSVFET was also validated with nearly symmetric behaviors (<tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\Delta \mathrm{C}_{\text{eff }} \& \Delta$</tex> delay <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$<3 {\%}$</tex>) and <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$38 \% / 60 {\%}$</tex> lower power than FinFET for 2 nanosheets (2NS) and 1NS design at iso-frequency based on ring oscillator (RO) simulation respectively. A RISC-V core was used for block level evaluation and 17.4% lower energy, 15% lower energy delay product (EDP) and 39.8% smaller areas were identified for the 1NS DSVFET with PowerVia (PV). DSVFET has proved to be a great candidate for future's EEC.
Authors
- Min Xu (ORCID: https://orcid.org/0000-0002-0881-5891)
- Wen Bu (ORCID: https://orcid.org/0000-0002-9939-9407)
- Xiang Wu (ORCID: https://orcid.org/0000-0001-8894-5188)
- Lisheng Zhang (ORCID: https://orcid.org/0000-0003-1872-9978)
- Xin He (ORCID: https://orcid.org/0000-0001-7009-2826)
- Jinfeng Kang (ORCID: https://orcid.org/0000-0002-6286-0423)
- Ru Huang (ORCID: https://orcid.org/0000-0001-7545-0987)
- Ying‐Hao Chu (ORCID: https://orcid.org/0000-0002-3435-9084)
- Tianxi X. Liu (ORCID: https://orcid.org/0000-0002-5592-7386)
- Zhe Xü (ORCID: https://orcid.org/0000-0002-9495-685X)
- Ruoyu Wang (ORCID: https://orcid.org/0000-0003-3463-5939)
- Yue Wu (ORCID: https://orcid.org/0000-0002-9820-2000)
- Zhenhua Wang (ORCID: https://orcid.org/0000-0002-6902-1059)
- Ming Li (ORCID: https://orcid.org/0000-0003-4279-6863)
- Yang Liu (ORCID: https://orcid.org/0000-0001-5953-3088)
- Jian Zhang (ORCID: https://orcid.org/0000-0002-0912-1197)
- Yu Wang (ORCID: https://orcid.org/0000-0002-4919-4390)
- Peng Ren (ORCID: https://orcid.org/0000-0002-3327-3393)
- Yili Zhang (ORCID: https://orcid.org/0000-0002-9474-1664)
- Fengrui Sun (ORCID: https://orcid.org/0000-0001-9254-6219)
- Jinlei Wu (ORCID: https://orcid.org/0000-0003-1328-5626)
- Huiling Lü (ORCID: https://orcid.org/0000-0003-4994-4646)
- Heng Wu (ORCID: https://orcid.org/0000-0002-6854-3373)
- Shuhan Liu (ORCID: https://orcid.org/0000-0001-5705-565X)
- Li Li (ORCID: https://orcid.org/0000-0003-2990-1614)
Institutions
- Peking University (CN)
- Songshan Lake Materials Laboratory (CN)
- Fraunhofer Institute for Integrated Circuits (DE)
- Shanghai Fudan Microelectronics (China) (CN)
- Shanghai Micro Electronics Equipment (China) (CN)
Publication Details
- Published
- 2025-06-08
- DOI
- https://doi.org/10.23919/vlsitechnologyandcir65189.2025.11075018
- Primary Topic
- Advancements in Semiconductor Devices and Circuit Design
- Type
- article
- Field-Weighted Citation Impact
- 0.00