Vertical 2T-nC FeRAM Demonstration: BEOL Read Transistor for 4F<sup>2</sup> Memory Strings and Two-Terminal Selector Design for Polarization Disturb Mitigation
In this work, we demonstrate a vertical 2T-nC FeRAM with a back-end-of-line (BEOL) read transistor (<tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$T_{\mathrm{R}}$</tex>) for <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$4 \mathrm{F}^{2}$</tex> string and propose a selector design to mitigate polarization disturb in passive capacitor crossbar arrays. Key contributions include: 1) successful integration and operation composed of a Si MOSFET write transistor (<tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$T_{\mathrm{W}}$</tex>), 3-layer cylindrical ferroelectric capacitors, and Si-doped <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\text{In}_{2} \mathrm{O}_{3}$</tex> BEOL <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$T_{\mathrm{R}}$</tex>, demonstrating the feasibility of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$4 \mathrm{F}^{2} 2 \mathrm{T}-\text{nC}$</tex> string; 2) introducing nonlinearity into the capacitor stack to suppress ferroelectric voltage drop under inhibition biases while maintaining sufficient write voltage, reducing disturbance; 3)modeling and experimental validation of inserting a metalsemiconductor (a-Si)-metal (MSM) selector into the capacitor in mitigating the disturb, particularly achieving 9x reduction of disturb after <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$10^{6}$</tex> cycles in the <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$V_{\mathrm{W}} / 2$</tex> scheme.
Authors
- Xiao Gong (ORCID: https://orcid.org/0000-0002-9243-1937)
- Yushan Lee
- Yixin Qin (ORCID: https://orcid.org/0000-0002-9298-9404)
- Shan Deng (ORCID: https://orcid.org/0000-0003-1137-8626)
- Jiahui Duan (ORCID: https://orcid.org/0000-0003-1097-5170)
- Zijian Zhao (ORCID: https://orcid.org/0000-0001-5191-6447)
- Shawming Ma
- John A. Howe
- Kai Ni (ORCID: https://orcid.org/0000-0002-3628-3431)
- Thomas Kämpfe (ORCID: https://orcid.org/0000-0002-4672-8676)
- Vijaykrishnan Narayanan (ORCID: https://orcid.org/0000-0001-6266-6068)
- Rajiv Joshi (ORCID: https://orcid.org/0009-0007-7486-1531)
- Sadik Yasir Tauki
Institutions
- University of Notre Dame (US)
- Pennsylvania State University (US)
- National University of Singapore (SG)
- Fraunhofer Institute for Photonic Microsystems (DE)
- IBM Research - Thomas J. Watson Research Center (US)
Publication Details
- Published
- 2025-06-08
- DOI
- https://doi.org/10.23919/vlsitechnologyandcir65189.2025.11074964
- Citations
- 2
- Primary Topic
- Ferroelectric and Negative Capacitance Devices
- Type
- article
- Field-Weighted Citation Impact
- 1.46