Epitaxial Graphene/n-Si Photodiode with Ultralow Dark Current and High Responsivity
Graphene's exceptional carrier mobility and broadband absorption make it promising for ultrafast photodetection. However, its low optical absorption limits responsivity, while the absence of a bandgap results in high dark current, constraining the signal-to-noise ratio and efficiency. Although silicon (Si) photodetectors normally offer fabrication compatibility, their performance is severely hindered by interface trap states and optical shading. To overcome these limitations, we demonstrate an epitaxial graphene/n-Si heterojunction photodiode. This device utilizes graphene epitaxially grown on germanium integrated with a transferred Si thin film, eliminating polymer residues and interface defects common in transferred graphene. As a result, the fabricated photodetector achieves an ultralow dark current of 1.2 × 10<sup>-9</sup> A, a high responsivity of 1430 A/W, and self-powered operation at room temperature. This work provides a strategy for high-sensitivity and low-power photodetection and demonstrates the practical integration potential of graphene/Si heterostructures for advanced optoelectronics.
Authors
- Xiaoyue Wang (ORCID: https://orcid.org/0000-0002-9950-2259)
- Lei Yin (ORCID: https://orcid.org/0000-0002-7626-2870)
- Shun Feng
Institutions
- University of Science and Technology of China (CN)
- Chinese Academy of Sciences (CN)
- Northeastern University (CN)
Publication Details
- Journal
- Nanomaterials
- Published
- 2025-08-03
- DOI
- https://doi.org/10.3390/nano15151190
- Primary Topic
- Graphene research and applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Natural Science Foundation of China
- Chinese Academy of Sciences
- China Postdoctoral Science Foundation
- National Key Research and Development Program of China
- Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences
- Shenyang National Laboratory for Materials Science