Hopfield model for patterns with internal structure

Abstract The spherical version of the Hopfield model for pattern recognition is considered in the static limit. Structures inside the patterns are modeled by Gaussian random variables that reward correlation between pairs of spins in a given pattern. The free energy is derived analytically with the replica method. The overlap distribution obeys a self-consistent equation. Coming from high temperatures, a spin glass phase is entered, in which patterns and correlations appear at lower temperatures. For small enough loading capacity, also a glass phase with patterns and correlations appears.