High-speed atomic force microscopy combined with a local excitation setup for photoactive materials
High-speed atomic force microscopy (HS-AFM) is a powerful tool for observing nanoscale structures and motions as a movie with high spatial (~1 nm) and temporal (10 frames per second) resolutions. Recent advancements have led to the development of a tip-scan stand-alone HS-AFM combined with an optical microscope, enhancing its capability in various fields. A promising application is the observation of photoactive materials such as azo-polymers, which is important for optical applications because of their unique nanoscale motion under light irradiation. In this study, we constructed a tip-scan HS-AFM combined with a local laser excitation setup for photoactive materials, allowing HS-AFM observations of azo-polymers under focused laser irradiation. We successfully observed the azo-polymer deformation dynamics under laser irradiation by HS-AFM. Moreover, real-time topographic line profile analyses facilitated precise investigations of morphological changes. This demonstration highlights the potential of HS-AFM for expanding its application to a broader range of material science.
Authors
- Hidekazu Ishitobi (ORCID: https://orcid.org/0000-0002-1145-6850)
- Prabhat Verma (ORCID: https://orcid.org/0000-0002-7781-418X)
- Feng-Yueh Chan (ORCID: https://orcid.org/0000-0002-4879-6015)
- Keishi Yang
- Takayuki Uchihashi (ORCID: https://orcid.org/0000-0002-0263-5312)
- Takayuki Umakoshi (ORCID: https://orcid.org/0000-0002-0479-1124)
- Yasushi Inouye (ORCID: https://orcid.org/0000-0001-5118-5146)
Institutions
- Guidedwave (United States) (US)
- Nagoya University (JP)
- The University of Osaka (JP)
Publication Details
- Published
- 2025-08-04
- DOI
- https://doi.org/10.1117/12.3065555
- Primary Topic
- Force Microscopy Techniques and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00