High-speed atomic force microscopy combined with a local excitation setup for photoactive materials

High-speed atomic force microscopy (HS-AFM) is a powerful tool for observing nanoscale structures and motions as a movie with high spatial (~1 nm) and temporal (10 frames per second) resolutions. Recent advancements have led to the development of a tip-scan stand-alone HS-AFM combined with an optical microscope, enhancing its capability in various fields. A promising application is the observation of photoactive materials such as azo-polymers, which is important for optical applications because of their unique nanoscale motion under light irradiation. In this study, we constructed a tip-scan HS-AFM combined with a local laser excitation setup for photoactive materials, allowing HS-AFM observations of azo-polymers under focused laser irradiation. We successfully observed the azo-polymer deformation dynamics under laser irradiation by HS-AFM. Moreover, real-time topographic line profile analyses facilitated precise investigations of morphological changes. This demonstration highlights the potential of HS-AFM for expanding its application to a broader range of material science.

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Published
2025-08-04
DOI
https://doi.org/10.1117/12.3065555
Primary Topic
Force Microscopy Techniques and Applications
Type
article
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article

High-speed atomic force microscopy combined with a local excitation setup for photoactive materials

Hidekazu Ishitobi, Prabhat Verma, Feng-Yueh Chan, Keishi Yang et al.
Force Microscopy Techniques and Applications
article

High-speed atomic force microscopy combined with a local excitation setup for photoactive materials

Hidekazu Ishitobi, Prabhat Verma, Feng-Yueh Chan, Keishi Yang, Takayuki Uchihashi, Takayuki Umakoshi, Yasushi Inouye
article en

Abstract

High-speed atomic force microscopy (HS-AFM) is a powerful tool for observing nanoscale structures and motions as a movie with high spatial (~1 nm) and temporal (10 frames per second) resolutions. Recent advancements have led to the development of a tip-scan stand-alone HS-AFM combined with an optical microscope, enhancing its capability in various fields. A promising application is the observation of photoactive materials such as azo-polymers, which is important for optical applications because of their unique nanoscale motion under light irradiation. In this study, we constructed a tip-scan HS-AFM combined with a local laser excitation setup for photoactive materials, allowing HS-AFM observations of azo-polymers under focused laser irradiation. We successfully observed the azo-polymer deformation dynamics under laser irradiation by HS-AFM. Moreover, real-time topographic line profile analyses facilitated precise investigations of morphological changes. This demonstration highlights the potential of HS-AFM for expanding its application to a broader range of material science.

Guidedwave (United States) (US), Nagoya University (JP), The University of Osaka (JP)
Openalex Percentile: Top 86%
Force Microscopy Techniques and Applications
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High-speed atomic force microscopy combined with a local excitation setup for photoactive materials — Hidekazu Ishitobi, Prabhat Verma, et al. · (2025) | TGRS Research Map | TGRS