Optical Fringe Projection: A Straightforward Approach to 3D Metrology
Optical fringe projection is an outstanding technology that significantly enhances three-dimensional (3D) metrology in numerous applications in science and engineering. Although the complexity of fringe projection systems may be overwhelming, current scientific advances bring improved models and methods that simplify the design and calibration of these systems, making 3D metrology less complicated. This paper provides an overview of the fundamentals of fringe projection profilometry, including imaging, stereo systems, phase demodulation, triangulation, and calibration. Some applications are described to highlight the usefulness and accuracy of modern optical fringe projection profilometers, impacting 3D metrology in different fields of science and engineering.
Authors
- Sofia Esquivel-Hernandez (ORCID: https://orcid.org/0000-0002-1914-0834)
- Víctor H. Diaz-Ramirez (ORCID: https://orcid.org/0000-0002-9331-1777)
- Rigoberto Juarez-Salazar (ORCID: https://orcid.org/0000-0001-6917-7558)
Institutions
- Instituto Politécnico Nacional (MX)
Publication Details
- Journal
- Metrology
- Published
- 2025-08-03
- DOI
- https://doi.org/10.3390/metrology5030047
- Citations
- 4
- Primary Topic
- Optical measurement and interference techniques
- Type
- article
- Field-Weighted Citation Impact
- 5.10
Funders
- Consejo Nacional de Ciencia y Tecnología