A Modified Multiple State Sampling Plan for Truncated Life Tests Based on the Weibull Distribution

This study introduces an innovative approach for a modified multiple state sampling plan in the context of truncated life tests, offering greater reliability compared to existing multiple dependent state (MDSSP) sampling plans. The proposed method is designed to handle scenarios where multiple items are tested simultaneously within a single testing apparatus. The methodology assumes that the lifespan of the product follows a Weibull distribution, with the shape parameter either known or unknown. Key design parameters—such as the number of testing groups and acceptance criteria—are determined by considering producer's and consumer's risks, as well as pre-specified quality levels. These calculations also account for fixed factors, including the termination time and the number of testers available. The outcomes of the proposed plan are demonstrated through illustrative examples and tabular representations, highlighting its practical applications and advantages over existing methods.