Knowledge-Augmented Zero-Shot Method for Power Equipment Defect Grading with Chain-of-Thought LLMs

As large language models (LLMs) increasingly enter specialized domains, inference without external resources often leads to knowledge gaps, opaque reasoning, and hallucinations. To address these challenges in power equipment defect grading, we propose a zero-shot question-answering framework that requires no task-specific examples. Our system performs two-stage retrieval—first using a Sentence-BERT model fine-tuned on power equipment maintenance texts for coarse filtering, then combining TF-IDF and semantic re-ranking for fine-grained selection of the most relevant knowledge snippets. We embed both the user query and the retrieved evidence into a Chain-of-Thought (CoT) prompt, guiding the pre-trained LLM through multi-step reasoning with self-validation and without any model fine-tuning. Experimental results show that on a held-out test set of 218 inspection records, our method achieves a grading accuracy of 54.2%, which is 6.0 percentage points higher than the fine-tuned BERT baseline at 48.2%; an Explanation Coherence Score (ECS) of 4.2 compared to 3.1 for the baseline; a mean retrieval latency of 28.3 ms; and an average LLM inference time of 5.46 s. Ablation and sensitivity analyses demonstrate that a fine-stage retrieval pool size of k = 30 offers the optimal trade-off between accuracy and latency; human expert evaluation by six senior engineers yields average Usefulness and Trustworthiness scores of 4.1 and 4.3, respectively. Case studies across representative defect scenarios further highlight the system’s robust zero-shot performance.

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Publication Details

Journal
Electronics
Published
2025-08-04
DOI
https://doi.org/10.3390/electronics14153101
Citations
2
Primary Topic
Non-Destructive Testing Techniques
Type
article
Field-Weighted Citation Impact
1.43

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article

Knowledge-Augmented Zero-Shot Method for Power Equipment Defect Grading with Chain-of-Thought LLMs

Pufan Liu, Lian Shen, Jianguang Du, Bo Li et al.
2 citations
Electronics
Non-Destructive Testing Techniques
1.43
article

Knowledge-Augmented Zero-Shot Method for Power Equipment Defect Grading with Chain-of-Thought LLMs

Pufan Liu, Lian Shen, Jianguang Du, Bo Li, Zhenyu Chen, Zhongyang Ran
article en
2 citations

Abstract

As large language models (LLMs) increasingly enter specialized domains, inference without external resources often leads to knowledge gaps, opaque reasoning, and hallucinations. To address these challenges in power equipment defect grading, we propose a zero-shot question-answering framework that requires no task-specific examples. Our system performs two-stage retrieval—first using a Sentence-BERT model fine-tuned on power equipment maintenance texts for coarse filtering, then combining TF-IDF and semantic re-ranking for fine-grained selection of the most relevant knowledge snippets. We embed both the user query and the retrieved evidence into a Chain-of-Thought (CoT) prompt, guiding the pre-trained LLM through multi-step reasoning with self-validation and without any model fine-tuning. Experimental results show that on a held-out test set of 218 inspection records, our method achieves a grading accuracy of 54.2%, which is 6.0 percentage points higher than the fine-tuned BERT baseline at 48.2%; an Explanation Coherence Score (ECS) of 4.2 compared to 3.1 for the baseline; a mean retrieval latency of 28.3 ms; and an average LLM inference time of 5.46 s. Ablation and sensitivity analyses demonstrate that a fine-stage retrieval pool size of k = 30 offers the optimal trade-off between accuracy and latency; human expert evaluation by six senior engineers yields average Usefulness and Trustworthiness scores of 4.1 and 4.3, respectively. Case studies across representative defect scenarios further highlight the system’s robust zero-shot performance.

ElectronicsVol. 14(15)
State Grid Corporation of China (China) (CN)
State Grid Corporation of China
Openalex Percentile: Top 18%
Non-Destructive Testing Techniques
1.43
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Knowledge-Augmented Zero-Shot Method for Power Equipment Defect Grading with Chain-of-Thought LLMs — Pufan Liu, Lian Shen, et al. · Electronics (2025) | TGRS Research Map | TGRS