LLM-Powered Test Case Generation for Detecting Bugs in Plausible Programs
Kaibo Liu, Zhenpeng Chen, Yiyang Liu, Jie M. Zhang, Mark Harman, Yudong Han, Yun Ma, Yihong Dong, Ge Li, Gang Huang. Proceedings of the 63rd Annual Meeting of the Association for Computational Linguistics (Volume 1: Long Papers). 2025.
Authors
- Mark Harman (ORCID: https://orcid.org/0000-0002-5864-4488)
- Yiyang Liu (ORCID: https://orcid.org/0009-0007-2466-2593)
- Zhenpeng Chen (ORCID: https://orcid.org/0000-0002-4765-1893)
- Yihong Dong
- Kaibo Liu (ORCID: https://orcid.org/0009-0005-9302-4953)
- Jie M. Zhang (ORCID: https://orcid.org/0000-0003-0481-7264)
- Ge Li (ORCID: https://orcid.org/0000-0002-5828-0186)
- Yun Ma (ORCID: https://orcid.org/0000-0001-7866-4075)
- Yudong Han (ORCID: https://orcid.org/0000-0003-4846-5803)
Publication Details
- Published
- 2025-01-01
- DOI
- https://doi.org/10.18653/v1/2025.acl-long.20
- Citations
- 5
- Primary Topic
- Radiation Effects in Electronics
- Type
- article
- Field-Weighted Citation Impact
- 3.65