A study on the design of D flip-flop with set and reset using GDI scheme

Abstract In this study, we propose a new D flip-flop (DFF) logic gate that includes a set/reset function using gate diffusion input (GDI) technology. Since this cell can be implemented with about 33% less MOS transistors than a conventional CMOS set/reset DFF, it is expected to significantly reduce the chip area occupied by sequential circuits. The cell characteristics were extracted using HSPICE, and a library for Synopsys DC, a synthesis tool, was developed. To verify the applicability of the RTL design flow, a 64-bit counter was designed, logic circuit synthesis was performed, and placement and routing (P&R) layout was performed using openROAD tool. The designed 64-bit counter showed a 22% increase in area in the sequential circuit.

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Publication Details

Journal
International Journal on Smart Sensing and Intelligent Systems
Published
2025-01-01
DOI
https://doi.org/10.2478/ijssis-2025-0036
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
0.00

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article

A study on the design of D flip-flop with set and reset using GDI scheme

Seungmin Jung
International Journal on Smart Sensing and Intelligent Systems
VLSI and Analog Circuit Testing
article

A study on the design of D flip-flop with set and reset using GDI scheme

Seungmin Jung
article en

Abstract

Abstract In this study, we propose a new D flip-flop (DFF) logic gate that includes a set/reset function using gate diffusion input (GDI) technology. Since this cell can be implemented with about 33% less MOS transistors than a conventional CMOS set/reset DFF, it is expected to significantly reduce the chip area occupied by sequential circuits. The cell characteristics were extracted using HSPICE, and a library for Synopsys DC, a synthesis tool, was developed. To verify the applicability of the RTL design flow, a 64-bit counter was designed, logic circuit synthesis was performed, and placement and routing (P&R) layout was performed using openROAD tool. The designed 64-bit counter showed a 22% increase in area in the sequential circuit.

International Journal on Smart Sensing and Intelligent SystemsVol. 18(1)
Hanshin University (KR)
Hanshin University
Openalex Percentile: Top 80%
VLSI and Analog Circuit Testing
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A study on the design of D flip-flop with set and reset using GDI scheme — Seungmin Jung · International Journal on Smart Sensing and Intelligent Systems (2025) | TGRS Research Map | TGRS