Effect of Annealing on the Physical Characteristics of In2O3 Nanoparticle Films

Indium (III) oxide film was deposited on glass by the thermal evaporation method to study the change in optical and structural characteristics as the annealing temperature varied from 100 to 300.The measurement of (XRD) revealed that the prepared and annealed films had a polycrystalline structure.Additionally, the results in terms of grain size and roughness were consistent with the results obtained from studying the surface topography of all films (before and after annealing) using an atomic force microscope (AFM).The optical characteristics also varied with changing annealing temperature, represented by the absorbance, transmittance, and reflectance spectra, and the optical constants, represented by the absorption coefficient, refractive index, and extinction coefficient.The energy gap was found (3.45-3.541)eV.