Comprehensive theoretical analysis of XPtSi (X = Ti, Zr, Hf) half-Heusler alloys: bridging the Slack equation and BTE for accurate thermoelectric predictions
This study highlights the role of carrier relaxation time in PF estimation & electronic thermal conductivity. Lattice thermal conductivity is assessed via Slack model & BTE, showing BTE is more accurate, crucial for reliable ZT calculation.
Authors
- Sudharsan Balasubramanian (ORCID: https://orcid.org/0000-0003-1229-6745)
- Priyanka D. Shobana
- M Eeshwaranath
Institutions
- ASA College (US)
- SRM Dental College (IN)
- Sri Sivasubramaniya Nadar College of Engineering (IN)
Publication Details
- Journal
- Journal of Materials Chemistry C
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1039/d5tc01795e
- Citations
- 3
- Primary Topic
- Heusler alloys: electronic and magnetic properties
- Type
- article
- Field-Weighted Citation Impact
- 1.28