Characterization of thin <sup><i>nat</i></sup>Si targets

The production of 26 Al is important in the field of stellar nucleosynthesis. The study for the production of 26 Al from the 28 Si(d, α) reaction at energies that are close to the Coulomb barrier requires thin silicon targets. This work reports the characterization of thin silicon targets by using the RBS (Rutherford Backscattering Spectrometry) technique, with proton beams, 12 C and 28 Si, taking into account a scattering angle of 140◦ at a range of energies ranging from 841 keV to 7105 keV. This experiment was carried out at the Nuclear Physics line of the National Accelerator Mass Spectrometry Laboratory (LEMA) of the Institute of Physics of UNAM. The first three targets to be characterized, labelled C11, C21 and C31 were fabricated at the Instituto de Investigaciones en Materiales (IIM-UNAM). The fourth target F11 was manufactured at the Microscopy Laboratory of the Institute of Physics (IF-UNAM). The thickness of the targets C11, C21 and C31 was 10 16 atoms/cm 2 . The thickness of the F11 target is 10 17 atoms/cm 2 , therefore, this target is suitable to be used in the production of 26 Al.

Authors

Institutions

Publication Details

Journal
EPJ Web of Conferences
Published
2025-01-01
DOI
https://doi.org/10.1051/epjconf/202533301003
Primary Topic
Boron and Carbon Nanomaterials Research
Type
article
Field-Weighted Citation Impact
0.00

Funders

Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Characterization of thin natSi targets

E. Chávez, D. J. Marı́n-Lámbarri, Arturo Rodríguez‐Gómez, J. Ruiz et al.
EPJ Web of Conferences
Boron and Carbon Nanomaterials Research
article

Characterization of thin natSi targets

E. Chávez, D. J. Marı́n-Lámbarri, Arturo Rodríguez‐Gómez, J. Ruiz, S. Mühl, A. Huerta, J.R. Fuentes-Carreón
article en

Abstract

The production of 26 Al is important in the field of stellar nucleosynthesis. The study for the production of 26 Al from the 28 Si(d, α) reaction at energies that are close to the Coulomb barrier requires thin silicon targets. This work reports the characterization of thin silicon targets by using the RBS (Rutherford Backscattering Spectrometry) technique, with proton beams, 12 C and 28 Si, taking into account a scattering angle of 140◦ at a range of energies ranging from 841 keV to 7105 keV. This experiment was carried out at the Nuclear Physics line of the National Accelerator Mass Spectrometry Laboratory (LEMA) of the Institute of Physics of UNAM. The first three targets to be characterized, labelled C11, C21 and C31 were fabricated at the Instituto de Investigaciones en Materiales (IIM-UNAM). The fourth target F11 was manufactured at the Microscopy Laboratory of the Institute of Physics (IF-UNAM). The thickness of the targets C11, C21 and C31 was 10 16 atoms/cm 2 . The thickness of the F11 target is 10 17 atoms/cm 2 , therefore, this target is suitable to be used in the production of 26 Al.

EPJ Web of ConferencesVol. 333
Instituto de Investigaciones en Ciencias de la Salud (AR), Universidad Nacional Autónoma de México (MX)
Consejo Nacional de Ciencia y Tecnología
Openalex Percentile: Top 86%
Boron and Carbon Nanomaterials Research
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.

Characterization of thin <sup><i>nat</i></sup>Si targets — E. Chávez, D. J. Marı́n-Lámbarri, et al. · EPJ Web of Conferences (2025) | TGRS Research Map | TGRS