Fiber cavity interferometry for imaging of reflecting samples

Abstract Recent advancements in optical fiber imaging and surface profiling techniques have significantly impacted various fields, including biomedical imaging and industrial metrology. This study investigates the integration of single mode fibers into a cavity interferometric system for enhanced surface profiling and imaging applications. By capturing the spectrum formed by light reflected off sample surfaces, the method effectively resolves intricate surface features. The system achieves a remarkable depth resolution of 0.2 µ m and an lateral resolution of 6.8 µ m, making it capable of capturing detailed images and accurately measuring surface profiles in a wide range (1–1000 µ m). The compact and portable design of the device facilitates its application across diverse industrial settings. A systematic calculation and experimental validation of the spot diameter is presented to optimize lateral resolution. The device was rigorously optimized and validated using a standard roughness sample, demonstrating a high level of agreement with expected results and confirming system reliability. The imaging and profiling capabilities of this system yield detailed insights into the width and shape of surface features, making it a valuable tool in both industrial and academic environments. Also, this device is poised for widespread adoption in applications ranging from automotive manufacturing to research laboratories, underscoring its versatility and effectiveness in surface analysis.