Terahertz Polarimetric System Based on Polarization Sensitive Frequency Selective Surfaces
We demonstrate a novel and cost-effective terahertz polarimetric system by incorporating a set of polarization sensitive frequency selective surfaces (PS-FSS) and Schottky diode detector with ultra-fast acquisition system. Those PS-FSSs are placed in a rotatable wheel with four distinct orientations such as 0°, 45°, 90° and 135° to calculate Stokes' parameters (S<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">0</inf>, S<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">1</inf>and S2 parameters). Here, frequency dependent polarization changes are being investigated in the case of 1.0 mm thick stacked quartz crystal at center frequency of 0.41 THz. From experimental results, it is noticed that through the rotation of PS-FSS chopper, we could extract the Stokes' parameters at 0.41 THz for each rotation angle of the sample in a very short time using this proposed compact and simple system.
Authors
- Jonathan Lafrenière-Greig
- F. Blanchard (ORCID: https://orcid.org/0000-0002-3335-7458)
- Redwan Ahmad (ORCID: https://orcid.org/0000-0002-5259-2656)
- X. Ropagnol (ORCID: https://orcid.org/0000-0001-8244-1544)
Institutions
- Xenobe Research Institute (US)
Publication Details
- Published
- 2025-05-20
- DOI
- https://doi.org/10.1109/pn66844.2025.11097179
- Primary Topic
- Optical Polarization and Ellipsometry
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- Canada Research Chairs
- Natural Sciences and Engineering Research Council of Canada