Reliability Characterizations on the Hybrid Hot-Cold Data Conversion in 3D NAND Flash Memory Under Various Temperatures
In this work, the reliability of Hot-Cold data conversion in 3D NAND Flash is evaluated by analyzing the Raw Bit Error Rate (RBER) under different temperatures. The conversion is achieved through read operations at varying frequencies, in which the RBER drops as the frequency increases. Our findings indicates the frequent read operations can enhance the storage reliability of cold data, which may provide potential insights to increase the lifetime of NAND flash memory.
Authors
- Pengpeng Sang (ORCID: https://orcid.org/0000-0001-8071-3024)
- Jixuan Wu (ORCID: https://orcid.org/0000-0002-5818-2623)
- Jiezhi Chen (ORCID: https://orcid.org/0000-0003-2996-1406)
- Yining Zhou (ORCID: https://orcid.org/0000-0003-3437-4687)
- Yixuan Fan (ORCID: https://orcid.org/0000-0003-2865-1422)
- Xuepeng Zhan (ORCID: https://orcid.org/0000-0002-1701-9301)
- Ruidong Li
- Xinghao Wang (ORCID: https://orcid.org/0000-0001-6205-4889)
- Yi Ding
- Peng Guo (ORCID: https://orcid.org/0000-0001-5585-292X)
Institutions
- Shandong University (CN)
- Sinochem Group (China) (CN)
- Cloud Computing Center (CN)
Publication Details
- Published
- 2025-06-08
- DOI
- https://doi.org/10.23919/snw65111.2025.11097269
- Primary Topic
- Advanced Data Storage Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Natural Science Foundation of China