Design Optimization of SiC CMOS FinFET for High-Temperature Next-Generation SoC Logic Applications
In this study, we demonstrate a high-temperature-operable binary inverter through structural optimization of a SiC CMOS FinFET. The <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$V_{\text{th}}$</tex> and SS were optimized to achieve CMOS-compatible operation. The resulting FinFET-based binary inverter operates at 3.3V, exhibiting a max gain of 8.2 and noise margin of 0.92V even at temperatures up to 500K, confirming its robustness for high-temperature CMOS applications.
Authors
- Jae Hwa Seo
- Young Jun Yoon (ORCID: https://orcid.org/0000-0001-8755-5057)
- Young Jo Kim (ORCID: https://orcid.org/0000-0001-8802-8996)
- Sung Yun Woo (ORCID: https://orcid.org/0000-0002-0857-3183)
- Taegyun Kwon (ORCID: https://orcid.org/0000-0002-1321-1814)
- Hyoung Woo Kim (ORCID: https://orcid.org/0000-0003-1047-5803)
Institutions
- Korea Electrotechnology Research Institute (KR)
- Uiduk University (KR)
- Kyungpook National University (KR)
Publication Details
- Published
- 2025-06-08
- DOI
- https://doi.org/10.23919/snw65111.2025.11097224
- Primary Topic
- Silicon Carbide Semiconductor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00