Cryogenic Thermal Conductivity Measurement of MoSi Films for Single Photon Detectors

We measure the thermal conductivity of amorphous MoSi superconducting films using the 3-omega method at cryogenic temperatures. Limitations on hotspot dynamics and thermal reset times in Superconducting Nanowire Single Photon Detectors will be discussed.

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Publication Details

Published
2025-01-01
DOI
https://doi.org/10.1364/quantum.2025.qth2a.3
Primary Topic
Thermal properties of materials
Type
article
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article

Cryogenic Thermal Conductivity Measurement of MoSi Films for Single Photon Detectors

Tom Q. Post, M. J. A. de Dood, Jacopo Piantanida Chiesa, Shuhul Mujoo
Thermal properties of materials
article

Cryogenic Thermal Conductivity Measurement of MoSi Films for Single Photon Detectors

Tom Q. Post, M. J. A. de Dood, Jacopo Piantanida Chiesa, Shuhul Mujoo
article en

Abstract

We measure the thermal conductivity of amorphous MoSi superconducting films using the 3-omega method at cryogenic temperatures. Limitations on hotspot dynamics and thermal reset times in Superconducting Nanowire Single Photon Detectors will be discussed.

Openalex Percentile: Top 87%
Thermal properties of materials
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Cryogenic Thermal Conductivity Measurement of MoSi Films for Single Photon Detectors — Tom Q. Post, M. J. A. de Dood, et al. · (2025) | TGRS Research Map | TGRS