Spin Squeezing in Electron Microscopy
We propose the concept of spin squeezing for electron interferometry, which offers a robust pathway toward quantum metrology in electron microscopy, promising to overcome the signal-to-noise ratio limit imposed by the electron-induced sample damage.
Authors
- S Haim (ORCID: https://orcid.org/0009-0000-0569-1769)
- Ido Kaminer (ORCID: https://orcid.org/0000-0003-2691-1892)
- Ron Ruimy (ORCID: https://orcid.org/0000-0003-4369-5589)
- Ephraim Shahmoon (ORCID: https://orcid.org/0000-0001-6190-5362)
- Alexey Gorlach (ORCID: https://orcid.org/0000-0002-0347-7141)
- Osip Schwartz (ORCID: https://orcid.org/0000-0001-7235-7197)
- Roni Ben-Maimon
- Ethan Nussinson
Institutions
- Technion – Israel Institute of Technology (IL)
- Weizmann Institute of Science (IL)
Publication Details
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1364/quantum.2025.qtu4c.4
- Primary Topic
- Advanced Electron Microscopy Techniques and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00