A High-Precision and Low-Complexity Framework for Calibration of Stand-Alone Merging Units

A novel technique is presented for the synchronization of sampled value (SV) streams generated according to the IEC 61869-9 and IEC 61850-9-2 standards by devices aligned via the Precision Time Protocol (PTP), with measurement data obtained from reference instruments that do not support PTP. The proposed solution, in conjunction with a pre-characterized sampling digital multimeter (DMM), enables automated calibration of stand-alone merging units (SAMUs). A thorough characterization of the phase error of the DMM across all voltage and current ranges in sampling mode is also reported.

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Publication Details

Journal
IEEE Transactions on Instrumentation and Measurement
Published
2025-01-01
DOI
https://doi.org/10.1109/tim.2025.3590834
Primary Topic
Advanced Measurement and Metrology Techniques
Type
article
Field-Weighted Citation Impact
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article

A High-Precision and Low-Complexity Framework for Calibration of Stand-Alone Merging Units

Andrei Pokatilov
IEEE Transactions on Instrumentation and Measurement
Advanced Measurement and Metrology Techniques
article

A High-Precision and Low-Complexity Framework for Calibration of Stand-Alone Merging Units

Andrei Pokatilov
article en

Abstract

A novel technique is presented for the synchronization of sampled value (SV) streams generated according to the IEC 61869-9 and IEC 61850-9-2 standards by devices aligned via the Precision Time Protocol (PTP), with measurement data obtained from reference instruments that do not support PTP. The proposed solution, in conjunction with a pre-characterized sampling digital multimeter (DMM), enables automated calibration of stand-alone merging units (SAMUs). A thorough characterization of the phase error of the DMM across all voltage and current ranges in sampling mode is also reported.

IEEE Transactions on Instrumentation and MeasurementVol. 74
National Institute for Health Development (EE), National Institute of Metrology (CN)
Openalex Percentile: Top 82%
Advanced Measurement and Metrology Techniques
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