Laser-driven proton sources for efficient radiation testing

Several fields such as particle physics, space exploration, and high-energy physics, use Commercial Off-The-Shelf (COTS) electronic components in a high-radiation operative environment. These operating conditions can cause significant damage to electronic circuits, affecting their operational features and thus the reliability of the entire facility. Qualifying and characterizing these components against radiation is essential to ensure their proper functioning in harsh conditions. This study investigates the effect of stress-testing electronic components used in high-radiation environments with various types of radiation sources. The components were exposed to gamma rays, laser-driven protons, conventionally accelerated protons, and neutrons, analyzing the devices parameters after different irradiation conditions. The results indicate significant degradation in electrical performance due to radiation-induced defects and significant variations of the effects at same dose delivery. We show that laser-driven proton irradiation achieves equivalent stress-testing with doses two orders of magnitude lower and much quicker than other radiation sources, demonstrating a much higher stress-testing efficiency.

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Publication Details

Journal
Scientific Reports
Published
2025-07-26
DOI
https://doi.org/10.1038/s41598-025-05682-x
Citations
3
Primary Topic
Laser-Plasma Interactions and Diagnostics
Type
article
Field-Weighted Citation Impact
5.61

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article

Laser-driven proton sources for efficient radiation testing

Maria Denise Astorino, S. Loreti, C. Ronsivalle, A. Ampollini et al.
3 citations
Scientific Reports
Laser-Plasma Interactions and Diagnostics
5.61
article

Laser-driven proton sources for efficient radiation testing

Maria Denise Astorino, S. Loreti, C. Ronsivalle, A. Ampollini, Fabio Panza, Ilaria Di Sarcina, Alessia Cemmi, G. Bazzano, Corrado Altomare, J. Scifo, A. Colangeli, Simon Vallières, Ronan Lelièvre, Paolo Nenzi, G. Pagano, P. Antici, S. Fourmaux, Beatrice D’Orsi, Elias Catrix, J. Fuchs, Douglas R. Lazzaro
article en
3 citations

Abstract

Several fields such as particle physics, space exploration, and high-energy physics, use Commercial Off-The-Shelf (COTS) electronic components in a high-radiation operative environment. These operating conditions can cause significant damage to electronic circuits, affecting their operational features and thus the reliability of the entire facility. Qualifying and characterizing these components against radiation is essential to ensure their proper functioning in harsh conditions. This study investigates the effect of stress-testing electronic components used in high-radiation environments with various types of radiation sources. The components were exposed to gamma rays, laser-driven protons, conventionally accelerated protons, and neutrons, analyzing the devices parameters after different irradiation conditions. The results indicate significant degradation in electrical performance due to radiation-induced defects and significant variations of the effects at same dose delivery. We show that laser-driven proton irradiation achieves equivalent stress-testing with doses two orders of magnitude lower and much quicker than other radiation sources, demonstrating a much higher stress-testing efficiency.

Scientific ReportsVol. 15(1)
National Agency for New Technologies, Energy and Sustainable Economic Development (IT), Institut de Radioprotection et de Sûreté Nucléaire (FR), Centre National de la Recherche Scientifique (FR), École Polytechnique (FR), Commissariat à l'Énergie Atomique et aux Énergies Alternatives (FR), Institut National de la Recherche Scientifique (CA), Sorbonne Université (FR), FIT Consulting (Italy) (IT), Laboratoire pour l'Utilisation des Lasers Intenses (FR), Hydro-Québec (CA)
Compute Canada, Natural Sciences and Engineering Research Council of Canada
Affordable and clean energy
Openalex Percentile: Top 5%
Laser-Plasma Interactions and Diagnostics
5.61
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