Simulation of voltage resistance testing for 12-bit low-power ADC chips

With the popularity of portable electronic devices, the demand for 12-bit low-power analog-to-digital converter (ADC) chips continues to grow. Considering that these devices typically rely on battery power, high precision and stability are crucial. In order to improve the voltage resistance of ADC chips under high voltage, an innovative bootstrap sampling switch design is proposed, which utilizes the capacitance characteristics of NMOS and PMOS transistors to enhance the voltage resistance of the chip. At the same time, considering factors such as power fluctuations, time domain and voltage interleaving, a two-stage hybrid architecture based on successive approximation registers (SARs) and time to digital converters (TDCs) was studied and designed to optimize the balance between low power consumption and high voltage resistance performance. The results showed that the power consumption of the chip design was only 9.5 mW. The voltage compensation measures significantly reduced the error value from 7.01% to 1.97%, optimizing 5.04%. In summary, this design not only improves the accuracy and speed of ADC chips, but also successfully controls the exponential growth of power consumption, which has strong practical value. The proposed solution by the research institute has broad potential in multiple application fields, especially suitable for situations with high requirements for power consumption and stability, such as medical imaging and aerospace. This design provides new ideas and directions for the development of high-performance and low-power ADC chips in the future.