TEB-YOLO: A Lightweight YOLOv5-Based Model for Bamboo Strip Defect Detection

The accurate detection of surface defects in bamboo is critical to maintaining product quality. Traditional inspection methods rely heavily on manual labor, making the manufacturing process labor-intensive and error-prone. To overcome these limitations, TEB-YOLO is introduced in this paper, a lightweight and efficient defect detection model based on YOLOv5s. Firstly, EfficientViT replaces the original YOLOv5s backbone, reducing the computational cost while improving feature extraction. Secondly, BiFPN is adopted in place of PANet to enhance multi-scale feature fusion and preserve detailed information. Thirdly, an Efficient Local Attention (ELA) mechanism is embedded in the backbone to strengthen local feature representation. Lastly, the original CIoU loss is replaced with EIoU loss to enhance localization precision. The proposed model achieves a precision of 91.7% with only 10.5 million parameters, marking a 5.4% accuracy improvement and a 22.9% reduction in parameters compared to YOLOv5s. Compared with other mainstream models including YOLOv5n, YOLOv7, YOLOv8n, YOLOv9t, and YOLOv9s, TEB-YOLO achieves precision improvements of 11.8%, 1.66%, 2.0%, 2.8%, and 1.1%, respectively. The experiment results show that TEB-YOLO significantly improves detection precision and model lightweighting, offering a practical and effective solution for real-time bamboo surface defect detection.