Characterization of Defects and Charge Transfer Simulation Modeling of the CCD290-99 Detector for the Earth 2.0’s Microlensing Telescope

The Earth 2.0 mission is designed to operate at the Sun-Earth L2 point for a four-year period, utilizing six transit telescopes and one microlensing telescope. The microlensing telescope is planned to employ a 9k×9k charge-coupled device (CCD) as its candidate detector. However, the space radiation environment poses significant challenges, leading to performance degradation of the detector, including an increased number of traps and a decline in charge transfer efficiency (CTE). To address these issues, it is crucial to study the characteristics of these traps. This paper focuses on characterizing the “Unknown”, (V − V)<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">−</sup> and P-V traps, which are responsible for image column-direction trailing in irradiated CCD detectors. Based on these findings, a charge transfer simulation model for the CCD290-99 detector was developed. Additionally, the model’s accuracy was validated using Extended Pixel Edge Response (EPER) curve measurements obtained under varying temperatures and line transfer times. The simulation results align well with experimental data, and the proportional distribution of various trap types was successfully determined. These findings provide valuable support for subsequent image correction efforts.